High and low temperature test device

 
Model¡GB-HL-6
Name¡GHigh and low temperature test device
Heat accumulating type high and low temperature test device is for cold and heat switch test on stationary object, that is widely used as test equipment for electronic components, elements, semiconductor, metal, chemical, material etc..
Characteristics¡G
¡E Contact microcomputer controller, easy to operate.
¡E Can set circulation and defrost times.
¡E Abnormity and malfunction point display and explanation.
¡E Comprehensive overall system safety protection with power off memory.
 
Model
H-TS-401

H-TS-402
H-TS-403
Test area dimension
35¡Ñ35¡Ñ40
50¡Ñ40¡Ñ40
60¡Ñ50¡Ñ50
Outer dimension
156¡Ñ200¡Ñ152
171¡Ñ205¡Ñ152
180¡Ñ230¡Ñ162
High temperature scope
+80¢J~+200¢J
Low temperature scope
-10¢J~-45¢J
Test temperature scope
+60¢J~+150¢J/-10¢J~-40¢J
Model
H-TS-501
H-TS-502
H-TH-503
Test area dimension
35¡Ñ35¡Ñ40
50¡Ñ40¡Ñ40
60¡Ñ50¡Ñ50
Outer dimension
156¡Ñ200¡Ñ152
171¡Ñ205¡Ñ152
180¡Ñ230¡Ñ162
High temperature scope
+80¢J~+200¢J
Low temperature scope
-10¢J~-60¢J
Test temperature scope
+60¢J~+150¢J/-10¢J~-55¢J
Model
H-TS-601
H-TS-602
H-TH-603
Test area dimension
35¡Ñ35¡Ñ40
50¡Ñ40¡Ñ40
60¡Ñ50¡Ñ50
Outer dimension
156¡Ñ200¡Ñ152
171¡Ñ205¡Ñ152
180¡Ñ230¡Ñ162
High temperature scope
+80¢J~+200¢J
Low temperature scope
-10¢J~-70¢J
Test temperature scope
+60¢J~+150¢J/-10¢J~-65¢J
 
 
 
 
 
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Constructed by Micropro Info Vision INC.